Digital Test Product AreasOptical/Communications Test RF/Microwave Test ATE/General Purpose Optical Components RF/Microwave Components Digital Test USB Instruments Manufacturing & Services Digital Test NRZ & PAM Pattern Generators up to 128 GBaud (256 Gbps) per Channel Error Analyzers up to 64 Gbps NRZ and 58 GBaud PAM4 Arbitrary Waveform Generators up to 60 GSa/s Multiplexers (MUX) & Demultiplexers (DEMUX) up to 128 Gbps Digital-to-Analog Converters (DAC) up to 128 GBaud (256 Gbps) SerDes Tester and BERT Functions, Pattern Generator Functions – 8 or 32 lanes, up to 32 Gbps NRZ & 56Gbps PAM4, handheld form-factor, USB Controlled, Software-Defined Test Solutions for: DDR4/DDR5 Memory Interfaces, PCIe, MIPI (Display, Touch, Imaging and Camera) and I3C MIPI DSI and DSI-2 Protocol Analyzer MIPI D-PHY and C-PHY Frame Grabbers World Leader in 1149.1 Boundary Scan Test and Programming Solutions Controllers available in: PXI, PCI, VXI, USB, Firewire and Ethernet Flash, PLD and CPLD programming via boundary scan Quote/Information Request Join Terablog Join Our Mail List Product Releases • Firmware Announcements • Latest News Follow Us
