Professional Technical Sales Organization

Semiconductor Test

FROM BOUNDARY SCAN TO 800G INTERFACES WE HAVE You covered

Enabling unprecedented technological innovations in machine learning, artificial intelligence, and high-performance computing, the semiconductor industry is experiencing a rapid shift in its development landscape. Such landscape is characterized by a dramatic increase in process steps during both the design and the manufacturing phases. It is also characterized by a sharp reduction in development schedules and a reliance on multiple disciplines and hybrid technologies. Our partners are in a unique position to address the test, characterization and validation requirements throughout the process – from initial design to production test.

Solutions We Offer:

Boundary Scan for Test and Validation
Hi-Speed, Highly Parallel, Protocol Aware SerDes Test Solutions for ATE or the Bench
Framed and un-Framed solutions for emerging Ethernet Standards (400G, 800G, PAM4)
Solutions for emerging display and memory interfaces: MIPI, DisplayPort, DDRx and I3C
BERTS

The Challenges

• Traditional ATE Systems can’t test “at speed” for today’s semiconductors
• Complex IP blocks need to be validated prior to Mfg
• Limited access to expensive equipment is a bottleneck in the Design and Validation Process
• FW and SW is a critical aspect of today’s semiconductors and needs to be exercised fully requiring a robust tester and automation tools
• Rapid volume ramps and complex designs demand capable and cost effective test solutions