Professional Technical Sales Organization

Semiconductor Test

FROM BOUNDARY SCAN TO 800G INTERFACES WE HAVE You covered

Enabling unprecedented technological innovations in machine learning, artificial intelligence, and high-performance computing, the semiconductor industry is experiencing a rapid shift in its development landscape. Such landscape is characterized by a dramatic increase in process steps during both the design and the manufacturing phases. It is also characterized by a sharp reduction in development schedules and a reliance on multiple disciplines and hybrid technologies. Our partners are in a unique position to address the test, characterization and validation requirements throughout the process – from initial design to production test.

Solutions We Offer:

  • Boundary Scan for Test and Validation
  • Hi-Speed, Highly Parallel, Protocol Aware SerDes Test Solutions for ATE or the Bench
  • Framed and un-Framed solutions for emerging Ethernet Standards (400G, 800G, PAM4)
  • Solutions for emerging display and memory interfaces: MIPI, DisplayPort, DDRx and I3C
  • BERTS

The Challenges

• Traditional ATE Systems can’t test “at speed” for today’s semiconductors
• Complex IP blocks need to be validated prior to Mfg
• Limited access to expensive equipment is a bottleneck in the Design and Validation Process
• FW and SW is a critical aspect of today’s semiconductors and needs to be exercised fully requiring a robust tester and automation tools
• Rapid volume ramps and complex designs demand capable and cost effective test solutions

The Capabilities We offer

• Hi-Speed, High Channel Count test solutions to augment traditional  ATE Systems for “at-speed” testing

• Electrical Speeds up to 256Gbps

• Testers capable of exercising and validating today’s complex IP blocks

• Capable and Cost Effective Test Solutions allowing for parallel deployment

• Testing for today’s Hi-Speed Communication and Interface Protocols:

• Ethernet, 400GE, 800GE, PAM4, MIPI, CSI, DSI, DisplayPort, DDRx, PCIe, I3C

ONT-800: Multi-protocol, multi-port  for lab and production testing

Optical/Protocol Transport Test (800G)

L1/L2 Support – Dynamic Skew, PCS / FEC Stress Testing, 100G Electrical

400G CFP2-DCO, QSFP-DD 400ZR, QSFP-DD800 & OSFP800 Stress Test

Multi-Services SVT – 400G Ethernet and beyond, OTUCn / FlexO , FlexE / SPN

• Testers for these application areas:

MIPI Physical Layers

MIPI Camera and Imaging

MIPI Display and Touch

DDR Memory Interfaces

PCI Express

MIPI Control and Data

MIPI I3C

DisplayPort

SerDes (BERTS) up to 32 channels up to 56Gbs

•  System Level Solutions

D-Series – Modules for integration with ATE

M-Series – Massively Parallel Solution up to 112 Tx and Rx Ch

• World Leader in 1149.1 Boundary Scan Test and Programming Solutions

• Controllers available in: PXI, PCI, VXI, USB, Firewire and Ethernet

• Flash, PLD and CPLD programming via boundary scan

High-performance FPGA based Ethernet Test and Monitoring solutions

Supports all speeds up to 25GbE including Automotive speeds, SGMII, and USXGMII

Layer 2/3 Traffic Generators/Analyzers

Network Impairment (WAN) Emulators

Inline Packet Capture Analyzers with 1 ns precision time-stamping