Photonic integrated circuits (PICs) are a key element in high-speed communications, optical computing, aerospace, defense and
medical applications. But, PICs can be challenging to test and measure, which is a significant contributor to the overall cost of bringing products to market. Effective testing of PICs requires more comprehensive and sophisticated methodologies to ensure optimal,
reliable performance and reduced development costs. TeraComm has solutions that meet the challenge!
• Small size requires sub mm resolution
• Measurement Accuracy
• Time to Test and Fully Characterize
• Precision VI control over many channels
• Micron Resolution Reflectometers to see inside the PIC
• Optical Vector Analyzers for full characterization in 1 sweep
• High Performance Analyzers and Meters
• Measure in Transmission or Reflection modes – High-speed Scanning available
• Up to 120 DC Channels Source/Measure System
• Optical Backscatter Reflectometers (OBR): 10 um resolution (Bench-top and Portable)
• C&L band Optical Vector Analyzer (OVA): Chromatic Dispersion, Group Delay, PMD, PDL
General Photonics and NewRidge Products:
• Polarization Controllers, Scramblers and Analyzers
• PMD & PDL generators and emulators
• OFDR-1000 Hi-Resolution Reflectometer
TeraComm, LLC
800 Village Walk, #296
Guilford, CT 06437
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